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ADVANTEST
T 5581H
Memory Test systems, 8" Configuration: CBOX I/F PE PIN: 960DR+576I/O Test Head Type: 1600CH 2’ND G
3
ADVANTEST
T 5581H
Memory Testers Configuration: CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.640DR+288I/O 2
2
ADVANTEST
T 5581H
Memory tester Includes (2) M6741A handlers Configuration: CONFIGURATION OF TEST HEAD PIN CONFIGURAT
2
ADVANTEST
T 5581H
Testers SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.640DR+28
2
ADVANTEST
T 5581H
Tester, parts system 250 MHz TH's Damaged parts: Main AC Pin cards Missing parts: MF Boards.
2
ADVANTEST
T 5581H
Memory tester PIN CONFIGURATION 1.640DR+288I/O 2.960DR+288I/O 3.640DR+576I/O 4.960DR+576I/O [1-4] .
2
ADVANTEST
T 5581H
Tester Dual head system Includes: (2) M6741 Handlers System configuration generate Configurat
2
ADVANTEST
T 5581H
Tester Dual head system Includes: (2) M6741 Handlers System configuration generate Configurat
2
ADVANTEST
T 5581H
Memory tester 250 MHz Configuration of test head: Pin configuration: 1.640DR+288I/O 2.960DR+288I/O
2
ADVANTEST
T 5581H
Memory tester 576 Channel 250MHz Dual head tester Dual station SDR / DDR / DDR2 1998 vintage.
2
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