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TERADYNE
J973
Testers Tester Computer: Sun ultra 2 383 Pins AXF 0: DC PWR AXF SLOT 1: MAC FAN AXF SLOT 6: PMU AXF
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인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
76
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
98
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
109
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
104
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
73
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
89
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
154
인기상품
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
77
인기상품
TERADYNE
J973
Test System J973-400AP VLSI Test System Includes: - Mainframe for channels 1-512 at 150ps edge
98
