판매용 중고 PARK SYSTEMS XE-70 #9225309

Atomic Force Microscope (AFM) XY Scanner: Single-module flexure with closed-loop control UV LED Head has been replaced Computer with (2) monitors Controller Light source Scan range: 100 μm x 100 μm 50 μm x 50 μm 10 μm x 10 μm Manual stage: XY Travel range: 13 x 13 mm Z Travel range: 29.5 mm Focus travel range: 70 mm Z Scanner range: Guided high-force Z scanner Scan range: 12 µm, 15 µm Sample mount: Sample size: Up to 100 mm Thickness: Up to 20 mm Direct on-axis vision of sample surface and cantilever Coupled with 10x objective lens Field-of-view: 480 x 360 µm CCD: Mpixel Electronics: DSP: 600 MHz with 4800 MIPS Maximum 16 data images Maximum data size: 4096 x 4096 Pixels Signal inputs: 20 Channels of 16 bit ADC at 500 kHz samplings Signal outputs: 21 Channels of 16 bit DAC at 500 kHz settling Synchronous signal: End-of-image End-of-line End-of-pixel TTL signals Includes: ACOUSTIC Enclosure MINUS K TECHNOLOGIES Platform Power: 120 W CE Marked.