판매용 중고 JEOL JSM 7401F #9147359

Field emission scanning electron microscope (FE-SEM) Resolution: 1.0nm (15kV), 1.5nm (1kV) Magnification: 25x to 1,000,000x Accelerating voltage: 0.1 to 30 kV Probe current: 10^-13 to 2×10^-9 A Electron gun: Cold field emission electron gun (Tungsten single crystal emitter) Objective lens: Strongly excited low aberration conical lens (3) Electron detectors: Upper secondary electron in-lens detector (SEI) Lower secondary electron detector (LEI) Retractable backscattered electrons detector (RBEI) IR Camera Specimen chamber: Diameter: 8" Airlock type: 150 (Diameter) × 10 (Height) mm specimen holder Specimen stage: Eucentric gioniometer stage 3-Axis computer controlled: X-Y: 70×50mm Rotation R: 360º Manual handling of Z-axis: 1.5 up to 25mm Tilt: -5° up to +70° Specimen holders: 12.5 (Diameter) × 10(Height) mm 26 (Diameter) × 10(Height) mm Wafer holders, 3"-4" STEM Holder Image process: 2/4 Divided display Pseudo color Image processing function (Sharpen, Gaussian, Smooth, Laplacian etc.) Operating system: Windows XP Supported image file formats: BMP, JPEG, TIFF Vacuum system: (3) Sputter ion pump units for Pgun~10-8Pa DP-DP Series system Fore-line trap for P specimen chamber ~ 10-5Pa Oil rotary pump 2006 vintage.