판매용 중고 JEOL JSM 6335F #293751833

ID: 293751833
Field Emission Scanning Electron Microscope (FE-SEM) SEI Detector Deben stage Magnification: 10x - 500000x Resolution: 15 kV: 1.5 nm (WD 4 mm) 1 kV: 5.0 nm (WD 4 mm).
아직 리뷰가 없습니다