판매용 중고 FEI Inspect S50 #9159235

Scanning Electron Microscope (SEM) Secondary Electron Detector (SED) Large Field Detector (LFD) low vacuum GBSD Included IR Camera for viewing sample in chamber Electron beam current measurement Color optical camera for sample navigation Tungsten hair pin type TMP Vacuum system Fully motorized stage system XL 30 Chamber system USB Connecting board nonfunctional 70 l/s Turbo Molecular Pump (TMP) Patented through-lens differential pumping Beam gas path length: 10 mm / 2 mm Oil rotary pump Chamber vacuum (High): 9.10-4 Pa Chamber vacuum (Low) < 10 to 270 Pa Evacuation time: ≤ 150 s to (High vacuum) ≤ 270 s to (Low vacuum) Low vacuum: 3.0 nm at 30 kV (SE) 4.0 nm at 30 kV (BSE) 10 nm at 3 kV (SE) Sample holders: Multi-stub holder Single stub mount Mounts directly on to stage Wafer and custom holder Does not include: Scintillator BSED / CLD Low Voltage Contrast Detector (VCD) High Contrast Detector (CD) Gaseous Analytical BSED (GAD) Cathodoluminescence WDS and EBSD Stem detector Packing list: Main chamber with desk for display (2) Control PCs (2) Monitors Oil rotary pump Control pad Keyboard Operating system: Windows 2000 2010 vintage.