판매용 중고 SII NANOTECHNOLOGY / SEIKO / HITACHI L-Trace II #293757979

SII NANOTECHNOLOGY / SEIKO / HITACHI L-Trace II
ID: 293757979
빈티지: 2012
Atomic Force Microscope (AFM) Sample stage, 6" Scanning method D/A converter control Maximum voltage: ± 200 V Maximum scan rotation : ±180° Maximum simultaneous measurement: 4 Power: 100 AC, 1.5 A, 50/60 Hz 2012 vintage.
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