판매용 중고 BRUKER / VEECO Dimension Icon #9037640

Atomic force microscopes X-Y scan range: 90µm x 90µm typical, 85µm minimum Z range: 10µm typical in imaging and force curve modes, 9.5µm minimum Vertical noise floor: <30pm RMS in appropriate environment typical imaging bandwidth (up to 625Hz) X-Y position noise (closed-loop): ≤0.15nm RMS typical imaging bandwidth (up to 625Hz) X-Y position noise (open-loop): ≤0.10nm RMS typical imaging bandwidth (up to 625Hz) Z sensor noise level (closed-loop): 35pm RMS typical imaging bandwidth (up to 625Hz); 50pm RMS, force curve bandwidth (0.1Hz to 5kHz) Integral nonlinearity (X-Y-Z): <0.5% typical Sample size/holder: 210mm vacuum chuck for samples, ≤210mm diameter, ≤15mm thick Motorized position stage: (X-Y axis) 180mm × 150mm inspectable area; 2µm repeatability, unidirectional; 3µm repeatability, bidirectional Microscope optics: 5-megapixel digital camera; 180µm to 1465µm viewing area; Digital zoom and motorized focus Controller: NanoScope V Workstation: Integrates all controllers and provides ergonomic design with immediate physical and visual access Vibration isolation: Integrated, pneumatic Acoustic isolation: Operational in environments with up to 85dBC continuous acoustic noise AFM modes: Standard: ScanAsyst, TappingMode (air), Contact Mode, Lateral Force Microscopy, PhaseImaging, Lift Mode, MFM, Force Spectroscopy, PeakForce Tuna, Force Volume, EFM, Surface Potential, Piezoresponse Microscopy, Force Spectroscopy Optional: PeakForce QNM, HarmoniX, Nanoindentation, Nanomanipulation, Nanolithograpy, Force Modulation (air/fluid), TappingMode (fluid), Torsional Resonance Mode, Dark Lift, STM, SCM, C-AFM, SSRM, TUNA, TR-TUNA, VITA.