판매용 중고 YOKOGAWA ST 6730 #9034562
URL이 복사되었습니다!
ID: 9034562
Tester
Configuration:
S1(eng)> dm inst
[ Installed modules display ]
pin map | 1 2 3 4 5 6
|1234567890123456 7890123456789012 3456789012345678 9012345678901234
[NSIO]--------------------------------------------------------------------------
1- 64|1111111111111111 1111111111111111 1111111111111111 ................
65- 128|1111111111111111 1111111111111111 1111111111111111 ................
129- 192|1111111111111111 1111111111111111 1111111111111111 ................
193- 256|1111111111111111 1111111111111111 1111111111111111 ................
[HSIO]--------------------------------------------------------------------------
257- 304|1111111111111111 1111111111111111 ................
pin map | 1 2 3 4 5 6
|1234567890123456 7890123456789012 3456789012345678 9012345678901234
[DIHD]--------------------------------------------------------------------------
513- 576|1111111111111111 1111111111111111 1111111111111111 1111111111111111
577- 640|1111111111111111 1111111111111111 1111111111111111 1111111111111111
Continue? (y/n)S1 Any Keyin> y
LCDPIN | 1 2 3 4
map |123456789012 345678901234 567890123456 789012345678
-------------------------------------------------------------
1001-1048|111111111111 111111111111 111111111111 111111111111
1049-1096|111111111111 111111111111 111111111111 111111111111
1097-1144|111111111111 111111111111 111111111111 111111111111
1145-1192|111111111111 111111111111 111111111111 111111111111
1193-1240|111111111111 111111111111 111111111111 111111111111
1241-1288|111111111111 111111111111 111111111111 111111111111
1289-1336|111111111111 111111111111 111111111111 111111111111
1337-1384|111111111111 111111111111 111111111111 111111111111
1385-1432|111111111111 111111111111 111111111111 111111111111
1433-1480|111111111111 111111111111 111111111111 111111111111
1481-1528|111111111111 111111111111 111111111111 111111111111
1529-1576|111111111111 111111111111 111111111111 111111111111
1577-1624|111111111111 111111111111 111111111111 111111111111
1625-1672|111111111111 111111111111 111111111111 111111111111
1673-1720|111111111111 111111111111 111111111111 111111111111
1721-1768|111111111111 111111111111 111111111111 111111111111
1769-1816|111111111111 111111111111 111111111111 111111111111
1817-1864|111111111111 111111111111 111111111111 111111111111
1865-1912|111111111111 111111111111 111111111111 111111111111
1913-1960|111111111111 111111111111 111111111111 111111111111
1961-2008|111111111111 111111111111 111111111111 111111111111
2009-2056|111111111111 111111111111 111111111111 111111111111
2057-2104|111111111111 111111111111 111111111111 111111111111
2105-2152|111111111111 111111111111 111111111111 111111111111
2153-2200|111111111111 111111111111 111111111111 111111111111
2201-2248|111111111111 111111111111 111111111111 111111111111
2249-2296|111111111111 111111111111 111111111111 111111111111
2297-2344|111111111111 111111111111 111111111111 111111111111
Continue? (y/n)S1 Any Keyin> y
| 1 2 3 4
|CH 123456789012 345678901234 567890123456 789012345678
------------+--------------------------------------------------------
PMU |20 111.111.111. 111.11111111
LCDPMU 1-48|96 111111111111 111111111111 111111111111 111111111111
49-96| 111111111111 111111111111 111111111111 111111111111
RVI 1-48|48 111111111111 111111111111 111111111111 111111111111
49-72| ............ ............
UVI | 8 11111111
CBIT |32 111111111111 111111111111 11111111
UVI map|12345678
-------+--------
map |11111111
fail |........
HDOT :1 XYCD :. GPIB :1 OT :.
RBIT :.
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
------------+-------------------------------------------------------------------
NSIO 1 | 1 6 4 256M 67108864words 1 0 .
NSIO 2 | 1 6 4 256M 67108864words 1 0 .
NSIO 3 | 1 6 4 256M 67108864words 1 0 .
NSIO 4 | .
NSIO 5 | 1 6 4 256M 67108864words 1 0 .
NSIO 6 | 1 6 4 256M 67108864words 1 0 .
NSIO 7 | 1 6 4 256M 67108864words 1 0 .
NSIO 8 | .
HSIO 1 | 1 1 0 128M 16777216words 1 0 .
HSIO 2 | 1 1 0 128M 16777216words 1 0 .
HSIO 3 | .
DIHD 1 | 1 1 4 . . . 0 .
DIHD 2 | 1 1 4 . . . 0 .
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
------------+-------------------------------------------------------------------
LLCD 1 | 1 4 0 256M 2097152words 1 5 .
LLCD 2 | 1 4 0 256M 2097152words 1 5 .
LLCD 3 | 1 4 0 256M 2097152words 1 5 .
LLCD 4 | 1 4 0 256M 2097152words 1 5 .
LLCD 5 | 1 4 0 256M 2097152words 1 5 .
LLCD 6 | 1 4 0 256M 2097152words 1 5 .
LLCD 7 | 1 4 0 256M 2097152words 1 5 .
LLCD 8 | 1 4 0 256M 2097152words 1 5 .
LLCD 9 | 1 4 0 256M 2097152words 1 5 .
LLCD 10 | 1 4 0 256M 2097152words 1 5 .
LLCD 11 | 1 4 0 256M 2097152words 1 5 .
LLCD 12 | 1 4 0 256M 2097152words 1 5 .
LLCD 13 | 1 4 0 256M 2097152words 1 5 .
LLCD 14 | 1 4 0 256M 2097152words 1 5 .
LLCD 15 | 1 4 0 256M 2097152words 1 5 .
LLCD 16 | 1 4 0 256M 2097152words 1 5 .
LLCD 17 | 1 4 0 256M 2097152words 1 5 .
LLCD 18 | 1 4 0 256M 2097152words 1 5 .
LLCD 19 | 1 4 0 256M 2097152words 1 5 .
LLCD 20 | 1 4 0 256M 2097152words 1 5 .
LLCD 21 | 1 4 0 256M 2097152words 1 5 .
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
--------------------------------------------------------------------------------
LLCD 22 | 1 4 0 256M 2097152words 1 5 .
LLCD 23 | 1 4 0 256M 2097152words 1 5 .
LLCD 24 | 1 4 0 256M 2097152words 1 5 .
LLCD 25 | 1 4 0 256M 2097152words 1 5 .
LLCD 26 | 1 4 0 256M 2097152words 1 5 .
LLCD 27 | 1 4 0 256M 2097152words 1 5 .
LLCD 28 | 1 4 0 256M 2097152words 1 5 .
LPMU 1 | 1 1 3 . . . 0 .
LPMU 2 | 1 1 3 . . . 0 .
LPMU 3 | 1 1 3 . . . 0 .
LPMU 4 | 1 1 3 . . . 0 .
LRVI 1 | 1 1 2 . . . 0 .
LRVI 2 | 1 1 2 . . . 0 .
LRVI 3 | .
LIDDQ 1 | 1 3 0 . . . 1 .
LIDDQ 2 | 1 3 0 . . . 1 .
DCREFT | 1 1 3 . . . 2 .
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
------------+-------------------------------------------------------------------
GSLM-A | 1 2 0 . . . 0 .
GSTR | 1 . 0 . . . 1 .
LSTM | 1 1 2 . . . - .
PAC1 | 1 6 1 256M 67108864words 1 0 .
PAC2 | 1 6 1 256M 67108864words 1 0 .
PACN | 1 6 1 256M 67108864words 1 0 .
NSMC | 1 1 3 256M 67108864words 1 1 .
LMIF | 1 1 1 256M 67108864words 1 0 .
GSTRPC | .
| imple address
--------------------------------------------------------------------------------
ARRAYUNIT(TSC)| 1 127.0.0.1
S1(eng)>
Level3 Diag:
<<<===== diag nsdutpath =====>>>
<Integrated result log>
NSIO DUT Path Test(diag nsdutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:14:29
End Time:2013/07/20 15:14:44
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag hsdutpath =====>>>
<Integrated result log>
HSIO DUT Path Test(diag hsdutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:15:07
End Time:2013/07/20 15:15:10
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag dfdutpath =====>>>
<Integrated result log>
DIHD DUT Path Test(diag dfdutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:15:17
End Time:2013/07/20 15:15:20
Exec Diag Level:3
Diag Ver:V1.03 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag rvidutpath =====>>>
<Integrated result log>
RVI DUT Path Test(diag rvidutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:15:26
End Time:2013/07/20 15:15:27
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag uvidutpath =====>>>
<Integrated result log>
UVI DUT Path Test(diag uvidutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:15:58
End Time:2013/07/20 15:16:06
Exec Diag Level:3
Diag Ver:V1.02R3 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcddutpath =====>>>
<Integrated result log>
LCD DUT Path Test(diag lcddutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:16:12
End Time:2013/07/20 15:17:38
Exec Diag Level:3
Diag Ver:V1.02R2 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag pdmdutpath =====>>>
<Integrated result log>
PDM DUT Path Test(diag pdmdutpath)------------------------------- <PASS>
Start Time:2013/07/20 15:18:53
End Time:2013/07/20 15:18:54
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag refdutpath =====>>>
<Integrated result log>
Reference DUT Path Test(diag refdutpath)------------------------- <PASS>
Start Time:2013/07/20 15:19:00
End Time:2013/07/20 15:19:00
Exec Diag Level:3
Diag Ver:V1.04 Station-Number:1 TesterID:ST01
1:GVG Reference Output Path-------------------------------- <PASS>
3:LS Input Path-------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag iddqdutpath =====>>>
<Integrated result log>
IDDQ DUT Path Test(diag iddqdutpath)----------------------------- <PASS>
Start Time:2013/07/20 15:19:07
End Time:2013/07/20 15:19:07
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST01
1:DUT Path------------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag dfrly =====>>>
<Integrated result log>
DIHD Relay Test(diag dfrly)-------------------------------------- <PASS>
Start Time:2013/07/20 15:19:13
End Time:2013/07/20 15:19:16
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:DIHDENB Relay-------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpmurly =====>>>
<Integrated result log>
LCDPMU Relay Test(diag lcdpmurly)-------------------------------- <PASS>
Start Time:2013/07/20 15:19:22
End Time:2013/07/20 15:19:41
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST01
1:DIR Relay------------------------------------------------ <PASS>
2:MTX Relay------------------------------------------------ <PASS>
3:LINE Relay----------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag rvirly =====>>>
<Integrated result log>
RVI Relay Test(diag rvirly)-------------------------------------- <PASS>
Start Time:2013/07/20 15:19:47
End Time:2013/07/20 15:19:49
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST01
1:DIR Relay------------------------------------------------ <PASS>
2:MTX Relay------------------------------------------------ <PASS>
3:LINE Relay----------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag iddqrly =====>>>
<Integrated result log>
IDDQ Relay Test(diag iddqrly)------------------------------------ <PASS>
Start Time:2013/07/20 15:19:56
End Time:2013/07/20 15:19:58
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST01
1:DUVIHF Rly On Resistance--------------------------------- <PASS>
2:LUVIHF Rly On Resistance--------------------------------- <PASS>
3:LIDDQHF Rly On Resistance-------------------------------- <PASS>
4:IDDQABHF Rly On Resistance------------------------------- <PASS>
5:L2JUMPHF Rly On Resistance------------------------------- <PASS>
6:L4JUMPHF Rly On Resistance------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpmupath =====>>>
<Integrated result log>
LCDPMU Path Test(diag lcdpmupath)-------------------------------- <PASS>
Start Time:2013/07/20 15:20:04
End Time:2013/07/20 15:20:06
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST01
1:LCDPMU Internal Path------------------------------------- <PASS>
2:LCDPMU Guard Path---------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag rvipath =====>>>
<Integrated result log>
RVI Path Test(diag rvipath)-------------------------------------- <PASS>
Start Time:2013/07/20 15:20:13
End Time:2013/07/20 15:20:15
Exec Diag Level:3
Diag Ver:V1.02R2 Station-Number:1 TesterID:ST01
1:RVI Internal Path---------------------------------------- <PASS>
2:RVI Guard Path------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpath =====>>>
<Integrated result log>
LCD DC Path Test(diag lcdpath)----------------------------------- <PASS>
Start Time:2013/07/20 15:20:21
End Time:2013/07/20 15:23:23
Exec Diag Level:3
Diag Ver:V1.03 Station-Number:1 TesterID:ST01
1:LCD DC Path---------------------------------------------- <PASS>
2:LCDCARD Path--------------------------------------------- <PASS>
3:LCDCARD RLYOFF------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag iddqpath =====>>>
<Integrated result log>
IDDQ Path Test(diag iddqpath)------------------------------------ <PASS>
Start Time:2013/07/20 15:23:30
End Time:2013/07/20 15:23:31
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:IDDQ Internal Path--------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag sysdcpath =====>>>
<Integrated result log>
System DC Path Test(diag sysdcpath)------------------------------ <PASS>
Start Time:2013/07/20 15:23:38
End Time:2013/07/20 15:23:42
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST01
1:UVI-LINE Path-------------------------------------------- <PASS>
2:PDMpath-------------------------------------------------- <PASS>
3:RVI-LINE Path-------------------------------------------- <PASS>
4:LCDPMU-LINE Path----------------------------------------- <PASS>
5:LCD-LINE Path-------------------------------------------- <PASS>
6:I/O Calibration Path------------------------------------- <PASS>
7:LCDMTX Jump Path----------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag syslcdpath =====>>>
<Integrated result log>
System LCD Path Test(diag syslcdpath)---------------------------- <PASS>
Start Time:2013/07/20 15:23:48
End Time:2013/07/20 15:23:48
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST01
1:Digitize Data Trans Path.-------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag nsstmpath =====>>>
<Integrated result log>
NSIO-STM Path Test(diag nsstmpath)------------------------------- <PASS>
Start Time:2013/07/20 15:23:55
End Time:2013/07/20 15:24:00
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST01
1:NSIO-STM HCMP Path--------------------------------------- <PASS>
2:NSIO-STM LCMP Path--------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag hsstmpath =====>>>
<Integrated result log>
HSIO-STM Path Test(diag hsstmpath)------------------------------- <PASS>
Start Time:2013/07/20 15:24:07
End Time:2013/07/20 15:24:07
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:HSIO-STM HCMP Path--------------------------------------- <PASS>
2:HSIO-STM LCMP Path--------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdstmpath =====>>>
<Integrated result log>
LCD-STM Path Test(diag lcdstmpath)------------------------------- <PASS>
Start Time:2013/07/20 15:24:14
End Time:2013/07/20 15:24:14
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:LCD-STM HCMP Path---------------------------------------- <PASS>
2:LCD-STM LCMP Path---------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag dcreftfunc =====>>>
<Integrated result log>
DCREFT Function Test(diag dcreftfunc)---------------------------- <PASS>
Start Time:2013/07/20 15:24:22
End Time:2013/07/20 15:24:28
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST01
1:Power-supply Voltage------------------------------------- <PASS>
2:Internal Ref. Output------------------------------------- <PASS>
3:External Ref. Output------------------------------------- <PASS>
4:PDM Ref. Input------------------------------------------- <PASS>
5:LPMU/LRVI Ref. Output------------------------------------ <PASS>
6:LLCD Ref. Output----------------------------------------- <PASS>
7:MTX Path------------------------------------------------- <PASS>
8:Other Function------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag nsfunc =====>>>
<Integrated result log>
NSIO Function Test(diag nsfunc)---------------------------------- <PASS>
Start Time:2013/07/20 15:24:51
End Time:2013/07/20 15:25:23
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST01
1:Pattern Generation--------------------------------------- <PASS>
2:Format Operation----------------------------------------- <PASS>
3:RTTC Operation------------------------------------------- <PASS>
4:Rate RTTC Operation-------------------------------------- <PASS>
5:SQPG Instruction----------------------------------------- <PASS>
6:Fail Test------------------------------------------------ <PASS>
<Detailed result log>
NSIO Function Test(diag nsfunc)
patgen1 : 1:Pattern Generation(Pattern RUN & STOP)----------- <PASS>
--------------------------------------
P/F Result Expect
--------------------------------------
P Current Address : 16 16
P Cycle Count : 17 17
--------------------------------------
format1 : 2:Format Operation(NRZ(Normal Pattern))------------ <PASS>
format2 : 2:Format Operation(RZ (Normal Pattern))------------ <PASS>
format3 : 2:Format Operation(R1 (Normal Pattern))------------ <PASS>
format4 : 2:Format Operation(SBC(Normal Pattern))------------ <PASS>
format5 : 2:Format Operation(NRZ(Double Pattern))------------ <PASS>
format6 : 2:Format Operation(RZ (Double Pattern))------------ <PASS>
format7 : 2:Format Operation(R1 (Double Pattern))------------ <PASS>
format8 : 2:Format Operation(SBC(Double Pattern))------------ <PASS>
format9 : 2:Format Operation(NRZ(Triple Pattern))------------ <PASS>
format10 : 2:Format Operation(RZ (Triple Pattern))------------ <PASS>
format11 : 2:Format Operation(R1 (Triple Pattern))------------ <PASS>
rttc1 : 3:RTTC Operation(RTTC Address Bit0)---------------- <PASS>
rttc2 : 3:RTTC Operation(RTTC Address Bit1)---------------- <PASS>
rttc3 : 3:RTTC Operation(RTTC Address Bit2)---------------- <PASS>
rttc4 : 3:RTTC Operation(RTTC Address Bit3)---------------- <PASS>
rttc5 : 3:RTTC Operation(RTTC Address Bit4)---------------- <PASS>
raterttc1 : 4:Rate RTTC Operation(Rate RTTC Address Bit0)------ <PASS>
raterttc2 : 4:Rate RTTC Operation(Rate RTTC Address Bit1)------ <PASS>
raterttc3 : 4:Rate RTTC Operation(Rate RTTC Address Bit2)------ <PASS>
raterttc4 : 4:Rate RTTC Operation(Rate RTTC Address Bit3)------ <PASS>
raterttc5 : 4:Rate RTTC Operation(Rate RTTC Address Bit4)------ <PASS>
pginst1 : 5:SQPG Instruction(Pattern Address Trace)---------- <PASS>
failtest1 : 6:Fail Test(Operation at PASS)--------------------- <PASS>
failtest2 : 6:Fail Test(Operation at FAIL)--------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag hsfunc =====>>>
<Integrated result log>
HSIO Function Test(diag hsfunc)---------------------------------- <PASS>
Start Time:2013/07/20 15:25:48
End Time:2013/07/20 15:25:55
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST01
1:Pattern Generation--------------------------------------- <PASS>
2:Format Operation----------------------------------------- <PASS>
3:RTTC Operation------------------------------------------- <PASS>
4:Rate RTTC Operation-------------------------------------- <PASS>
5:SQPG Instruction----------------------------------------- <PASS>
6:Fail Test------------------------------------------------ <PASS>
<Detailed result log>
HSIO Function Test(diag hsfunc)
patgen1 : 1:Pattern Generation(Pattern RUN & STOP)----------- <PASS>
--------------------------------------
P/F Result Expect
--------------------------------------
P Current Address : 16 16
P Cycle Count : 17 17
--------------------------------------
format1 : 2:Format Operation(NRZ(Normal Pattern))------------ <PASS>
format2 : 2:Format Operation(RZ (Normal Pattern))------------ <PASS>
format3 : 2:Format Operation(R1 (Normal Pattern))------------ <PASS>
format4 : 2:Format Operation(SBC(Normal Pattern))------------ <PASS>
format5 : 2:Format Operation(NRZ(Double Pattern))------------ <PASS>
format6 : 2:Format Operation(RZ (Double Pattern))------------ <PASS>
format7 : 2:Format Operation(R1 (Double Pattern))------------ <PASS>
format8 : 2:Format Operation(SBC(Double Pattern))------------ <PASS>
format9 : 2:Format Operation(NRZ(Triple Pattern))------------ <PASS>
format10 : 2:Format Operation(RZ (Triple Pattern))------------ <PASS>
format11 : 2:Format Operation(R1 (Triple Pattern))------------ <PASS>
rttc1 : 3:RTTC Operation(RTTC Address Bit0)---------------- <PASS>
rttc2 : 3:RTTC Operation(RTTC Address Bit1)---------------- <PASS>
rttc3 : 3:RTTC Operation(RTTC Address Bit2)---------------- <PASS>
rttc4 : 3:RTTC Operation(RTTC Address Bit3)---------------- <PASS>
rttc5 : 3:RTTC Operation(RTTC Address Bit4)---------------- <PASS>
raterttc1 : 4:Rate RTTC Operation(Rate RTTC Address Bit0)------ <PASS>
raterttc2 : 4:Rate RTTC Operation(Rate RTTC Address Bit1)------ <PASS>
raterttc3 : 4:Rate RTTC Operation(Rate RTTC Address Bit2)------ <PASS>
raterttc4 : 4:Rate RTTC Operation(Rate RTTC Address Bit3)------ <PASS>
raterttc5 : 4:Rate RTTC Operation(Rate RTTC Address Bit4)------ <PASS>
pginst1 : 5:SQPG Instruction(Pattern Address Trace)---------- <PASS>
failtest1 : 6:Fail Test(Operation at PASS)--------------------- <PASS>
failtest2 : 6:Fail Test(Operation at FAIL)--------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpmufunc =====>>>
<Integrated result log>
LCDPMU Function Test(diag lcdpmufunc)---------------------------- <PASS>
Start Time:2013/07/20 15:26:03
End Time:2013/07/20 15:26:04
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST01
1:ADC Measurement Function--------------------------------- <PASS>
<Detailed result log>
LCDPMU Function Test(diag lcdpmufunc)
measADC1 : 1:ADC Measurement Function(V=0V, RNG=X1)--------- <PASS>
----------------------------------------------------------------
PF CH Value[LSB]([V]) L-Limit[LSB]([V]) U-Limit[LSB]([V])
----------------------------------------------------------------
P 1 0x7fc1(+0.00240) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 7 0x7fab(+0.00324) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 13 0x7fca(+0.00206) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 19 0x7fb5(+0.00286) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 25 0x7fad(+0.00317) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 31 0x7fc9(+0.00210) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 37 0x7f97(+0.00401) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 43 0x7fcd(+0.00195) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 49 0x7fd5(+0.00164) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 55 0x7fe7(+0.00095) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 61 0x7fc7(+0.00217) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 67 0x7fe0(+0.00122) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 73 0x7fc3(+0.00233) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 79 0x7fc1(+0.00240) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 85 0x7fce(+0.00191) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 91 0x7fca(+0.00206) 0x7f3b(+0.00750) 0x80c4(-0.00750)
----------------------------------------------------------------
measADC2 : 1:ADC Measurement Function(V=0V, RNG=X5)--------- <PASS>
----------------------------------------------------------------
PF CH Value[LSB]([V]) L-Limit[LSB]([V]) U-Limit[LSB]([V])
----------------------------------------------------------------
P 1 0x8007(-0.00027) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 7 0x7f8b(+0.00446) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 13 0x8023(-0.00134) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 19 0x7f97(+0.00401) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 25 0x7f81(+0.00484) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 31 0x8019(-0.00095) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 37 0x7f1b(+0.00874) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 43 0x8014(-0.00076) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 49 0x803b(-0.00225) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 55 0x809f(-0.00607) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 61 0x8004(-0.00015) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 67 0x805d(-0.00355) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 73 0x7fe7(+0.00095) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 79 0x7fd8(+0.00153) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 85 0x8005(-0.00019) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 91 0x7fec(+0.00076) 0x7c28(+0.03750) 0x83d7(-0.03750)
----------------------------------------------------------------
measADC3 : 1:ADC Measurement Function(V=0V, RNG=X10)-------- <PASS>
----------------------------------------------------------------
PF CH Value[LSB]([V]) L-Limit[LSB]([V]) U-Limit[LSB]([V])
----------------------------------------------------------------
P 1 0x805e(-0.00359) 0x7851(+0.07500) 0x87ae(-0.07500)
P 7 0x7f66(+0.
YOKOGAWA ST 6730은 회로 내 최종 테스트를 위해 설계된 완전 자동화 된 회로 내 테스트 장비입니다. 고속 (High Speed), 고정밀 (High Precision) 시스템으로서 요구 사항에 대한 규정 준수를 보장하는 포괄적인 회로 테스트 기능을 제공합니다. 이 장치는 단일 프레임에 최대 16 개의 테스트 사이트를 갖춘 멀티 사이트 아키텍처 (Multi-site architecture) 를 갖추고 있어 더 크고 복잡한 회로 보드를 효율적으로 테스트할 수 있습니다. ST 6730은 3D 이미징 및 전기 임피던스 단층 촬영 (Electrical Impedance Tomography) 과 같은 혁신적인 기술을 사용하여 보다 빠르고 정확한 구성 요소 테스트를 수행합니다. 이 시스템은 고속 (High Speed) 데이터 프로세싱 및 데이터 전송 기능을 갖춘 고속 테스트 컨트롤러 (High Speed Test Controller) 를 장착하여 전반적인 테스트 성능을 향상시킵니다. 테스트 컨트롤러 (Test Controller) 에는 지능형 데이터 스크래핑 (scraping) 기술이 적용되어 테스트 결과를 저장하는 데 걸리는 시간을 줄이고 이를 분석합니다. YOKOGAWA ST 6730은 또한 더 복잡한 테스트 설정을 허용하는 고속, 높은 정확도 멀티 채널 스위칭 매트릭스를 갖추고 있습니다. ST 6730 은 다양한 용도로, 개별 테스트 요구에 맞게 맞춤형으로 구성할 수 있습니다. 직관적인 GUI (Graphical User Interface) 를 통해 테스트 프로그램을 손쉽게 만들고 편집할 수 있으며 테스트 프로세스를 실시간으로 모니터링할 수 있습니다. 효율적이고 세심한 테스트 실행을 위해 자산에는 구성 요소에 대한 규정 준수 및 장애 감지 (fault detection) 테스트를 수행하는 자동화된 소프트웨어 제품인 사이트테스터 (SourceTester) 도 함께 제공됩니다. 또한 포괄적인 데이터 관리, 데이터 수집 및 결과 분석 기능을 제공합니다. YOKOGAWA ST 6730은 다양한 예산에 적합한 유연한 구성을 갖춘 비용 효율적인 모델입니다. 이 제품은 다양한 제품 지원, 유지 보수, 교육 프로그램으로, 장비가 최적의 성능으로 실행되고 있는지 확인합니다. 이 시스템은 모듈식으로 설계되었기 때문에 쉽게 업그레이드할 수 있어 유연성이 향상되고 고급 테스트 (advanced testing) 를 수행할 수 있습니다. 결론적으로 ST 6730 은 다양한 애플리케이션에 대해 안정적이고 포괄적인 회로 내 테스트 기능을 제공합니다. 빠른 속도, 정확성, 유연성을 통해 수많은 조립 및 제조 부지에 이상적인 솔루션이 됩니다. 이 장치는 사용자가 투자를 최대한 활용하도록 구성, 사용, 유지 관리하기 쉽습니다 (영문).
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