loading

2817 results for found: 익숙한 X-ray

1 2 3 4 5 6 다음 것
  • ACCENT OPTICAL / PHILIPS: PLM 150

    ACCENT OPTICAL / PHILIPS PLM 150 Photoluminescence system A green doubled YAG 532 nm laser is used as the laser source The Vis 1200 is used as the visible range grating with a blazing wavelength of 750 nm The notch filter in this system should be functioning equal or better than that of the PLM 100 system System is equipped with a Laser notch filter Not certain about whether it is a holographic filter The stage is equipped with L-shaped bracket for 2-4" wafers The top surface of the stage is big enough for 6-8" wafer, when the L-shaped bracket for 2-4" wafer is removed This system is not equipped with cassette handler 2003 vintage.
  • ACCENT OPTICAL / PHILIPS: PLM 100

    ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.
  • ACCENT OPTICAL / PHILIPS: PLM 100

    ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.
  • ACCENT OPTICAL / PHILIPS: PLM 100

    ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool Includes: Probe source Monochromator Grating Detector Optional: Diode laser source: COHERENT Tutcore F6-980-10-450C-100-FC-M Peak wavelength: 971.8 nm Centroid: 971.9 nm FWHM: 0.5 nm 2002 vintage.
  • ACCENT OPTICAL / PHILIPS: PLM 100

    ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.
  • ACCENT OPTICAL / PHILIPS: PLM 100

    ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.
  • ACCENT OPTICAL / PHILIPS PLM: PLM 150

    ACCENT OPTICAL / PHILIPS PLM 150 Photoluminescence system A green doubled YAG 532 nm laser is used as the laser source The Vis 1200 is used as the visible range grating with a blazing wavelength of 750 nm The notch filter in this system should be functioning equal or better than that of the PLM 100 system System is equipped with a Laser notch filter Not certain about whether it is a holographic filter The stage is equipped with L-shaped bracket for 2-4” wafers The top surface of the stage is big enough for 6-8” wafer, when the L-shaped bracket for 2-4” wafer is removed This system is not equipped with cassette handler 2003 vintage.
  • ACCENT OPTICAL / PHILIPS PLM: PLM 100

    ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool Includes: Probe source Monochromator Grating Detector Optional: Diode laser source: COHERENT Tutcore F6-980-10-450C-100-FC-M Peak wavelength: 971.8 nm Centroid: 971.9 nm FWHM: 0.5 nm 2002 vintage.
  • ADE: NANOMAPPER

    ADE NanoMapper X-ray spectrometer 2001 vintage.
  • AFP IMAGING GROUP: MINI NDT 9992501600

    AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.
  • AFP IMAGING GROUP: MINI NDT 9992501600

    AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.
  • AFP IMAGING GROUP: MINI NDT 9992501600

    AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.
  • AFP IMAGING GROUP: MINI NDT 9992501600

    AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.
  • AGILENT: 5DX SERIES 2L

    AGILENT 5DX Series 2L PCB X-ray system Currently warehoused 2000 vintage.
  • AGILENT: 5300-5DX-S2L

    AGILENT 5300-5DX-S2L in-line 3D X-ray machines Bar codereader Multi-link workstation Max board size: 457x609mm 2000 vintage.
  • AGILENT: 5DX SERIES 5000

    AGILENT 5DX Series 5000 X-ray machine with defective X-ray tube Installed, 2006 vintage.
  • AGILENT: 5300 5DX SERIES 2

    AGILENT 5300 5DX Series 2 X-ray system for spare parts 2L with SMEMA loaders Missing controller, digital camera and digital camera controller Scintillator is non-functional.
  • AGILENT: MEDALIST X6000

    AGILENT Medalist X6000 3D X-Ray system 2008 vintage.
  • ALVORD SYSTEMS: QZ45

    ALVORD SYSTEMS QZ45 Piezogoniometer x-ray defraction inspection system, 2000 vintage.
  • ALVORD SYSTEMS: QZ45

    ALVORD SYSTEMS QZ45 Piezogoniometer x-ray defraction inspection system, 2000 vintage.
보여 주다 페이지 당
1 2 3 4 5 6 다음 것